An Interferometric Method of Measuring Reflection Coefficients
- 作者: Kovalyov A.A.1
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隶属关系:
- Rzhanov Institute of Semiconductor Physics, Siberian Branch
- 期: 卷 124, 编号 6 (2018)
- 页面: 850-854
- 栏目: Physical Optics
- URL: https://ogarev-online.ru/0030-400X/article/view/165726
- DOI: https://doi.org/10.1134/S0030400X18060139
- ID: 165726
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详细
A method for determining the reflection coefficients of optical elements, which is based on the use of a reflection interferometer, is proposed. The results of measurements with a He–Ne laser for several samples with different reflectivity levels are presented. Comparison with results of conventional measurements is made. The gain from the use of the reflection interferometer is estimated.
作者简介
A. Kovalyov
Rzhanov Institute of Semiconductor Physics, Siberian Branch
编辑信件的主要联系方式.
Email: kovalev@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090
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