An Interferometric Method of Measuring Reflection Coefficients


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A method for determining the reflection coefficients of optical elements, which is based on the use of a reflection interferometer, is proposed. The results of measurements with a He–Ne laser for several samples with different reflectivity levels are presented. Comparison with results of conventional measurements is made. The gain from the use of the reflection interferometer is estimated.

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A. Kovalyov

Rzhanov Institute of Semiconductor Physics, Siberian Branch

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Email: kovalev@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

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