An Interferometric Method of Measuring Reflection Coefficients
- Авторлар: Kovalyov A.A.1
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Мекемелер:
- Rzhanov Institute of Semiconductor Physics, Siberian Branch
- Шығарылым: Том 124, № 6 (2018)
- Беттер: 850-854
- Бөлім: Physical Optics
- URL: https://ogarev-online.ru/0030-400X/article/view/165726
- DOI: https://doi.org/10.1134/S0030400X18060139
- ID: 165726
Дәйексөз келтіру
Аннотация
A method for determining the reflection coefficients of optical elements, which is based on the use of a reflection interferometer, is proposed. The results of measurements with a He–Ne laser for several samples with different reflectivity levels are presented. Comparison with results of conventional measurements is made. The gain from the use of the reflection interferometer is estimated.
Авторлар туралы
A. Kovalyov
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Хат алмасуға жауапты Автор.
Email: kovalev@isp.nsc.ru
Ресей, Novosibirsk, 630090
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