Spectral Sensitization of Photo-EMF in Monocrystalline Silicon
- Authors: Goryaev M.A.1
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Affiliations:
- Herzen State Pedagogical University of Russia
- Issue: Vol 127, No 1 (2019)
- Pages: 167-169
- Section: Optical Materials
- URL: https://ogarev-online.ru/0030-400X/article/view/166049
- DOI: https://doi.org/10.1134/S0030400X19070087
- ID: 166049
Cite item
Abstract
The effect of an organic dye deposited on the surface of a semiconductor on the photo-EMF spectrum in monocrystalline silicon has been studied. Sensitization of the internal photoeffect has been found in the semiconductor in the absorption band of the dye. An optimal concentration of the dye on the semiconductor surface that corresponds to a dye film thickness of 10–15 nm has been determined. The mechanism of sensitization is discussed on the basis of the theory of nonradiative inductive-resonant energy transfer from the dye to the semiconductor.
About the authors
M. A. Goryaev
Herzen State Pedagogical University of Russia
Author for correspondence.
Email: mgoryaev@mail.ru
Russian Federation, St. Petersburg, 191186
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