On Diffraction Phenomena in Sensors of Surface Waves


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Abstract

The diffraction phenomena associated with the limited aperture size of an incident wave are considered on the basis of a theoretical method for studying the reflection of a plane electromagnetic wave from a plane-layered multifilm structure with homogeneous films. The proposed theory is applied to the analysis of the sensitivity of sensors based on surface waves.

About the authors

A. B. Petrin

Joint Institute of High Temperatures

Author for correspondence.
Email: a_petrin@mail.ru
Russian Federation, Moscow, 125412

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