Optical properties of nonstoichiometric ZrOx according to spectroellipsometry data


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

Amorphous nonstoichiometric ZrOx films of different composition have been synthesized by the method of ion-beam sputtering deposition of metallic zirconium in the presence of oxygen at different partial oxygen pressures in the growth zone, and their optical properties have been studied in the spectral range of 1.12–4.96 eV. It is found that light-absorbing films with metallic conductivity are formed at the partial oxygen pressure below 1.04 × 10–3 Pa and transparent films with dielectric conductivity are formed at the pressure above 1.50 × 10–3 Pa. It is shown that the spectral dependences of optical constants of ZrOx films are described well by the corresponding dispersion models: the Cauchy polynomial model for films with dielectric conductivity and the Lorentz–Drude oscillator model for films with metallic conductivity.

About the authors

V. N. Kruchinin

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Author for correspondence.
Email: kruch@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

V. Sh. Aliev

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: kruch@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

A. K. Gerasimova

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: kruch@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

V. A. Gritsenko

Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University

Email: kruch@isp.nsc.ru
Russian Federation, Novosibirsk, 630090; Novosibirsk, 630090

Supplementary files

Supplementary Files
Action
1. JATS XML

Copyright (c) 2016 Pleiades Publishing, Ltd.