Optimization of sensors based on surface waves in flat-layered structures

Abstract

A method for increasing the sensitivity of surface-wave sensors in multifilm structures is proposed based on the results of a theoretical study of the reflection of a plane electromagnetic wave from a flat-layered structure containing homogeneous films. A method for optimizing the parameters of the films forming the surface structure is developed and tested. The devices proposed are characterized by high field amplification in a surface layer of multifilm structure and a higher sensitivity to variations in the optical properties of the thin near-surface layer. Application of the proposed multifilm structures is expected to increase significantly the sensitivity of the existing sensors based on surface-plasmon polaritons, which are applied in modern optical multichannel biological, chemical, and physical sensor systems.