Atomic Rearrangements and Photoemission Processes at a p-GaN(Cs)–Vacuum Interface


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详细

Spontaneous changes in photoemission properties of a р-GaN(Cs)–vacuum interface with effective negative electronic affinity induced by rearrangements of its atomic structure have been studied for the first time. The optimum Сs coating that ensures both the maximum photoelectron escape probability and its stability has been found. A thermodynamic model has been proposed to escape the relation of the photoemission properties of the р-GaN(Cs)–vacuum interface to its free energy and entropy.

作者简介

V. Bakin

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: terek@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

S. Kosolobov

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: terek@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

S. Rozhkov

Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University

Email: terek@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090; Novosibirsk, 630090

H. Scheibler

Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University

Email: terek@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090; Novosibirsk, 630090

A. Terekhov

Rzhanov Institute of Semiconductor Physics, Siberian Branch

编辑信件的主要联系方式.
Email: terek@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

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