电邮这篇文章 Phase Transformations in the Film-Substrate System Irradiated with e-beam
- 作者: Ivanov Y.F.1,2, Klopotov A.A.2,3, Potekaev A.I.2,4, Laskovnev A.P.5, Teresov A.D.1,2, Tsvetkov N.A.3, Petrikova E.A.1,2, Krysina O.V.1,2, Ivanova O.V.3, Shugurov V.V.1, Shegidevich A.A.5, Kulagina V.V.6,4
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隶属关系:
- High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences
- National Research Tomsk State University
- Tomsk State Architecture and Building University
- V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
- Physical Technical Institute of the National Academy of Sciences
- Siberian State Medical University
- 期: 卷 60, 编号 1 (2017)
- 页面: 175-180
- 栏目: Article
- URL: https://ogarev-online.ru/1064-8887/article/view/237907
- DOI: https://doi.org/10.1007/s11182-017-1057-z
- ID: 237907
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详细
It is reported that irradiation of the film/substrate system (Zr–Ti–Cu)/(A7) with a high-intensity electron beam is followed by the formation of a multi-phase state, whose microhardness is approximately by a factor of 4.5 higher than that of the technical grade aluminum А7, which is due to the substrate structure grain refinement and precipitation of zirconium aluminides in the surface layer.
作者简介
Yu. Ivanov
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
编辑信件的主要联系方式.
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk; Tomsk
A. Klopotov
National Research Tomsk State University; Tomsk State Architecture and Building University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk; Tomsk
A. Potekaev
National Research Tomsk State University; V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk; Tomsk
A. Laskovnev
Physical Technical Institute of the National Academy of Sciences
Email: yufi55@mail.ru
白俄罗斯, Minsk
A. Teresov
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk; Tomsk
N. Tsvetkov
Tomsk State Architecture and Building University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk
E. Petrikova
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk; Tomsk
O. Krysina
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk; Tomsk
O. Ivanova
Tomsk State Architecture and Building University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk
V. Shugurov
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk
A. Shegidevich
Physical Technical Institute of the National Academy of Sciences
Email: yufi55@mail.ru
白俄罗斯, Minsk
V. Kulagina
Siberian State Medical University; V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
Email: yufi55@mail.ru
俄罗斯联邦, Tomsk; Tomsk
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