Peculiarities of the Short-Pulse Dielectric Strength of Vacuum Insulation


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

Results of a study of the short-pulse dielectric strength of millimeter plane vacuum gaps with electrodes that have been treated with an electron beam are presented. It is shown that the electric field strength of the first breakdown of vacuum gaps with pure metal electrodes is determined to a significant extent by the crystal structure of the metal. The development of the first short-pulse breakdown is accompanied by a very abrupt growth of the electric current. The short duration of the test pulses rules out the influence of all well-known inertial mechanisms of breakdown with characteristic action times greater than 20 ns. Some general assumptions regarding the nature of the factors stimulating the short-pulse breakdown of vacuum gaps are considered.

Негізгі сөздер

Авторлар туралы

E. Nefedtsev

Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University

Хат алмасуға жауапты Автор.
Email: nev@lve.hcei.tsc.ru
Ресей, Tomsk; Tomsk

S. Onischenko

Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences

Email: nev@lve.hcei.tsc.ru
Ресей, Tomsk

A. Batrakov

Institute of High-Current Electronics of the Siberian Branch of the Russian Academy of Sciences

Email: nev@lve.hcei.tsc.ru
Ресей, Tomsk

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Springer Science+Business Media, LLC, part of Springer Nature, 2017