Analysis of integrated thyristor switching-off by a reverse gate pulse current
- 作者: Grekhov I.V.1, Lyublinsky A.G.1, Mikhailov E.M.1, Poloskin D.S.1, Skidanov A.A.2
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隶属关系:
- Ioffe Institute
- ZAO VZPP-Micron
- 期: 卷 62, 编号 11 (2017)
- 页面: 1684-1688
- 栏目: Solid State Electronics
- URL: https://ogarev-online.ru/1063-7842/article/view/200240
- DOI: https://doi.org/10.1134/S1063784217110111
- ID: 200240
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详细
To increase the maximum power current density of an integrated n+p'Nn'p+-type thyristor during switching-off by a current pulse in the control circuit, the injection of electrons from the n+ emitter should be interrupted before the recovery of the collector p'N junction. This has been done using a rapidly increasing reverse gate current pulse with an amplitude equal to the amplitude of the power switched-off current. After the interruption of the emitter injection, the remaining current through the device is the current of holes extracted from the collector region via the gate electrode. Like in insulated gate bipolar transistors (IGBTs), the physical mechanism that limits the maximum density of the switch-off current is the dynamic avalanche breakdown, which is initiated by the holes extracted through the space charge region of the collector p'N junctions.
作者简介
I. Grekhov
Ioffe Institute
编辑信件的主要联系方式.
Email: grekhov@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
A. Lyublinsky
Ioffe Institute
Email: grekhov@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
E. Mikhailov
Ioffe Institute
Email: grekhov@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
D. Poloskin
Ioffe Institute
Email: grekhov@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
A. Skidanov
ZAO VZPP-Micron
Email: grekhov@mail.ioffe.ru
俄罗斯联邦, Voronezh, 394033
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