Ion-Optical System of an Ion Source with Energy Focusing in the Formed Beam


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Resumo

Ways to reduce ion beam intensity losses in a mass spectrometric ion source, which are caused by chromatic aberration of its immersion ion-optical system, are considered. These losses are rather significant in forming a beam from ions with a large energy spread. The reduction of aberration losses is especially important when ion sources are used jointly with mass analyzers with energy focusing. It is shown that these losses can be reduced significantly by using a new type of ion-optical system of the ion source, which includes achromatic elements. A special method for calculating such elements is given. Computer simulations have shown high efficiency of such elements in the ion-optical path of ion sources of mass spectrometers.

Sobre autores

N. Samsonova

Ioffe Institute

Email: agreer@bk.ru
Rússia, St. Petersburg, 194021

N. Gall’

Ioffe Institute

Email: agreer@bk.ru
Rússia, St. Petersburg, 194021

L. Gall’

Institute of Analytical Instrumentation, Russian Academy of Sciences

Email: agreer@bk.ru
Rússia, St. Petersburg, 190103

I. Averin

Institute of Analytical Instrumentation, Russian Academy of Sciences

Autor responsável pela correspondência
Email: agreer@bk.ru
Rússia, St. Petersburg, 190103

A. Berdnikov

Institute of Analytical Instrumentation, Russian Academy of Sciences

Email: agreer@bk.ru
Rússia, St. Petersburg, 190103

S. Masyukevich

Institute of Analytical Instrumentation, Russian Academy of Sciences

Email: agreer@bk.ru
Rússia, St. Petersburg, 190103

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