Silicon-based shortwave differential photodetector
- Авторлар: Gavrushko V.V.1, Ionov A.S.1, Kadriev O.R.1, Lastkin V.A.1
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Мекемелер:
- Yaroslav-the-Wise Novgorod State University
- Шығарылым: Том 62, № 2 (2017)
- Беттер: 338-340
- Бөлім: Short Communications
- URL: https://ogarev-online.ru/1063-7842/article/view/199010
- DOI: https://doi.org/10.1134/S1063784217020104
- ID: 199010
Дәйексөз келтіру
Аннотация
The silicon-based photodetector that contains two n+–p photodiode with equal areas has been described. One of the photodiodes had a wide spectral characteristic with high sensitivity in the UV range. The sensitivity of the second photodiode was decreased in the shortwave range via the formation of additional recombination centers in the near-surface region using the implantation of As ions. The study of the spectral sensitivity of the differential signal obtained by photocurrent subtraction has revealed a profound shortwave spectral characteristic. The boundaries of spectral range at λ0.5 were in the limits of 0.27–0.44 μm. The maximum sensitivity corresponded to λmax = 0.36 μm. The sensitivity of the differential channel at this wavelength reached 83% of that of the wide-range channel.
Авторлар туралы
V. Gavrushko
Yaroslav-the-Wise Novgorod State University
Хат алмасуға жауапты Автор.
Email: Valery.Gavrushko@novsu.ru
Ресей, Velikiy Novgorod, 173003
A. Ionov
Yaroslav-the-Wise Novgorod State University
Email: Valery.Gavrushko@novsu.ru
Ресей, Velikiy Novgorod, 173003
O. Kadriev
Yaroslav-the-Wise Novgorod State University
Email: Valery.Gavrushko@novsu.ru
Ресей, Velikiy Novgorod, 173003
V. Lastkin
Yaroslav-the-Wise Novgorod State University
Email: Valery.Gavrushko@novsu.ru
Ресей, Velikiy Novgorod, 173003
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