Structure and orientation of Al2O3 fibers used in YBa2Cu3Oy sputtering

Abstract

The internal structure and orientation of thin (150–300 μm) flexible Al₂O₃ fibers used as substrates for third-generation high-temperature superconducting wires are studied by different methods. It is shown that using scanning electron microscopy, electron backscatter diffraction, transmission electron microscopy, and X-ray diffraction, one can reliably determine the position of the \((1\bar 102)\) plane, on which good YBa₂Cu₃O_y films can be grown.