作者的详细信息
Il’ina, M. V.
| 期 | 栏目 | 标题 | 文件 |
| 卷 63, 编号 8 (2018) | Experimental Instruments and Technique | Atomic Force Microscopy Measurement of the Resistivity of Semiconductors | |
| 卷 63, 编号 11 (2018) | Physical Electronics | Nonuniform Elastic Strain and Memristive Effect in Aligned Carbon Nanotubes |