Author Details
Il’ina, M. V.
| Issue | Section | Title | File |
| Vol 63, No 8 (2018) | Experimental Instruments and Technique | Atomic Force Microscopy Measurement of the Resistivity of Semiconductors | |
| Vol 63, No 11 (2018) | Physical Electronics | Nonuniform Elastic Strain and Memristive Effect in Aligned Carbon Nanotubes |