Предисловие - PDF (Russian)
Copyright (c) 2023 Russian Academy of Sciences
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Keywords
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
numerical simulation
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
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Keywords
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
numerical simulation
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Subscription
Login to verify subscription