Exact Analytical Solutions of the Problem of Electromagnetic-Wave Reflection from Dielectric Layers with New Types of Inhomogeneities

Resumo

We describe a method for finding new classes of monotonic and nonmonotonic profiles of the refractive index in inhomogeneous layers, which allow one to obtain exact analytical solutions of the direct problem of electromagnetic-field reflection. The possibility of using inhomogeneous layers for optical antireflection coating is discussed.