Raman spectroscopy of the interface between a thin nanostructured ZnO film and fullerene C60

E. A. Zakhidov; M. A. Zakhidova; A. M. Kokhkharov; Sh. K. Nematov; R. A. Nusretov; V. O. Kuvondikov; A. A. Saparbaev

doi:10.1134/S0030400X1704021X

Raman spectroscopy of the interface between a thin nanostructured ZnO film and fullerene C60

Autores: Zakhidov E.A.¹, Zakhidova M.A.¹, Kokhkharov A.M.¹, Nematov S.K.¹, Nusretov R.A.¹, Kuvondikov V.O.¹, Saparbaev A.A.¹
Afiliações:
1. Institute of Ion-Plasma and Laser Technologies
Edição: Volume 122, Nº 4 (2017)
Páginas: 607-614
Seção: Condensed-Matter Spectroscopy
URL: https://ogarev-online.ru/0030-400X/article/view/165371
DOI: https://doi.org/10.1134/S0030400X1704021X
ID: 165371

Citar

Texto integral

Acesso aberto
Acesso é fechado

Acesso está concedido
Acesso é fechado

Somente assinantes

Resumo
Sobre autores
Bibliografia
Arquivos suplementares
Estatísticas

Resumo

The resonance and nonresonance Raman scattering in the interface between a thin ZnO film with a well-developed nanostructured surface morphology and a layer of fullerene C60 molecules deposited on this film has been investigated. It is shown that the intensity of the interaction between the C60 molecules and ZnO film surface can be estimated based on the spectral scattering characteristics.