Optical properties of thin Cu2ZnSnS4, films produced by RF magnetron sputtering
- Авторлар: Maistruk E.V.1, Mar’yanchuk P.D.1, Solovan M.N.1, Pinna F.2, Tresso E.2
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Мекемелер:
- Chernovtsi National University
- Politecnico di Torino
- Шығарылым: Том 123, № 1 (2017)
- Беттер: 38-43
- Бөлім: Condensed-Matter Spectroscopy
- URL: https://ogarev-online.ru/0030-400X/article/view/165436
- DOI: https://doi.org/10.1134/S0030400X17070153
- ID: 165436
Дәйексөз келтіру
Аннотация
Optical properties of thin Cu2ZnSnS4 films produced by RF magnetron sputtering of preliminarily synthesized material are studied. Transmission and reflection coefficients are studied in a range from 0.4 to 26 μm. The optical band-gap width depending on substrate temperature is estimated; in optimal modes, it is equal to 1.47 eV. The study of electrical properties shows that Cu2ZnSnS4 possesses low charge-carrier mobility, μ = 1.9 cm2/(V s), at room temperature and hole concentration р = 5 × 1018 cm–3. Electron microscopy shows that the film possesses a polycrystalline structure with a crystallite size on the order of 100 nm.
Авторлар туралы
E. Maistruk
Chernovtsi National University
Хат алмасуға жауапты Автор.
Email: e.maistruk@chnu.edu.ua
Украина, Chernovtsi, 58012
P. Mar’yanchuk
Chernovtsi National University
Email: e.maistruk@chnu.edu.ua
Украина, Chernovtsi, 58012
M. Solovan
Chernovtsi National University
Email: e.maistruk@chnu.edu.ua
Украина, Chernovtsi, 58012
F. Pinna
Politecnico di Torino
Email: e.maistruk@chnu.edu.ua
Италия, Torino, 10129
E. Tresso
Politecnico di Torino
Email: e.maistruk@chnu.edu.ua
Италия, Torino, 10129
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