Optics and Spectroscopy
ISSN 0030-400X (Print)
ISSN 1562-6911 (Online)
Menu
Archives
Home
About the Journal
Editorial Team
Editorial Policies
Author Guidelines
About the Journal
Issues
Search
Current
Retracted articles
Archives
Contact
All Journals
User
Username
Password
Remember me
Forgot password?
Register
Notifications
View
Subscribe
Search
Search
Search Scope
All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
By Sections
Other Journals
Subscription
Login to verify subscription
Keywords
Biological Tissue
Electronic Absorption Spectrum
Harmonic Generation
Harmonic Spectrum
Helium Atom
IR spectroscopy
Luminescence Intensity
Raman Spectrum
Raman scattering
Refractive Index
Silver Nanoparticles
Spectral Line
Ultrashort Pulse
ellipsometry
luminescence
nonlinear optics
optical properties
quantum dots
singlet oxygen
thin films
wavefront sensor
×
User
Username
Password
Remember me
Forgot password?
Register
Notifications
View
Subscribe
Search
Search
Search Scope
All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
By Sections
Other Journals
Subscription
Login to verify subscription
Keywords
Biological Tissue
Electronic Absorption Spectrum
Harmonic Generation
Harmonic Spectrum
Helium Atom
IR spectroscopy
Luminescence Intensity
Raman Spectrum
Raman scattering
Refractive Index
Silver Nanoparticles
Spectral Line
Ultrashort Pulse
ellipsometry
luminescence
nonlinear optics
optical properties
quantum dots
singlet oxygen
thin films
wavefront sensor
Home
>
Search
>
Author Details
Author Details
Shvets, V. A.
Issue
Section
Title
File
Vol 121, No 3 (2016)
Physical Optics
Analytical solution of the direct problem of ellipsometry for some profiles of optical constants of inhomogeneous layers
Vol 123, No 2 (2017)
Physical Optics
A method for measuring the phase of the reflection coefficient in the visible range of the spectrum
Vol 123, No 5 (2017)
Condensed-Matter Spectroscopy
Dispersion of the refractive index in high-
k
dielectrics
Vol 127, No 2 (2019)
Nanophotonics
Determining the Compositional Profile of HgTe/Cd
x
Hg
1 –
x
Te Quantum Wells by Single-Wavelength Ellipsometry
TOP