Experimental-Theoretical Approach to Determining the Film–Substrate Adhesion


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There are well-known methods and algorithms for determining the film adhesion to a plane substrate, which have their own advantages and drawbacks and the applicability ranges. The substrates can have a good initial shape (spherical, cylindrical, etc,) covered, for example, by a thin film layer. But there are practically no studies of the film adhesion to a substrate with a nonplane surface. A two-dimensional approach to determining the film adhesion to a plane or a nonplane substate is developed, which permits increasing the accuracy of determining the adhesion and decreasing the scattering of the obtained results. An example is considered.

Sobre autores

S. Yakupov

Institute of Mechanics and Engineering of the Kazan Scientific Center of the Russian Academy of Sciences

Autor responsável pela correspondência
Email: tamas_86@mail.ru
Rússia, ul. Lobachevskogo 2/31, Kazan, 420111

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