A Diode-Based Detector of Fast Neutral Atoms at a Gas Dynamic Trap
- 作者: Pinzhenin E.I.1, Maximov V.V.1,2, Chistokhin I.B.3
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隶属关系:
- Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences
- Novosibirsk State University
- Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
- 期: 卷 62, 编号 2 (2019)
- 页面: 185-192
- 栏目: General Experimental Techniques
- URL: https://ogarev-online.ru/0020-4412/article/view/160625
- DOI: https://doi.org/10.1134/S0020441219020131
- ID: 160625
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详细
A multichannel diagnostic unit for charge-exchange atoms was created at the Gas Dynamic Trap to study fast ions with energies in the thermonuclear range, which are produced during high-power atomic injection. Two detection systems based on the pinhole camera principle were developed to observe the radial distribution of the emission of charge-exchange atoms. AXUV16ELG semiconductor photodiodes, as well as experimental diodes developed by the Rzhanov Institute of Semiconductor Physics that are capable of operating in the avalanche amplification mode, are used as sensitive the elements. Using this diagnostic unit, it is possible to study the dynamics of accumulation and confinement of fast particles and, in particular, to investigate the processes associated with the magnetohydrodynamic activity of hot ion plasma under conditions of a high relative pressure.
作者简介
E. Pinzhenin
Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences
编辑信件的主要联系方式.
Email: e.i.pinzhenin@inp.nsk.su
俄罗斯联邦, Novosibirsk, 630090
V. Maximov
Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences; Novosibirsk State University
编辑信件的主要联系方式.
Email: v.v.maximov@inp.nsk.su
俄罗斯联邦, Novosibirsk, 630090; Novosibirsk, 630090
I. Chistokhin
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
编辑信件的主要联系方式.
Email: igor@isp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090
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