A Scanning Interferometric Method for Studying the Converse Flexoelectric Effect in Thin Plates of Ferroelectrics and Related Materials
- Авторы: Zalesskii V.G.1, Obozova E.D.1, Polushina A.D.1
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Учреждения:
- Ioffe Institute
- Выпуск: Том 62, № 6 (2019)
- Страницы: 830-837
- Раздел: General Experimental Techniques
- URL: https://ogarev-online.ru/0020-4412/article/view/160975
- DOI: https://doi.org/10.1134/S0020441219060150
- ID: 160975
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Аннотация
A scanning interferometric method for studying inhomogeneous deformations of thin plates of dielectric crystals under the action of a homogeneous electric field (converse flexoelectric effect) is proposed. The results of using this method to determine the type and magnitude of inhomogeneous deformations (spherical and cylindrical bending deformations) with an accuracy of up to 10 nm in model perovskite ferroelectric single crystals and related materials are demonstrated.
Об авторах
V. Zalesskii
Ioffe Institute
Автор, ответственный за переписку.
Email: nsh@mail.ioffe.ru
Россия, St. Petersburg, 194021
E. Obozova
Ioffe Institute
Email: nsh@mail.ioffe.ru
Россия, St. Petersburg, 194021
A. Polushina
Ioffe Institute
Email: nsh@mail.ioffe.ru
Россия, St. Petersburg, 194021
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