The Influence of the Form of a Curvature Regulator Substrate on the Curvature of the Profile of X-ray Optics Elements
- Autores: Gribko V.V.1, Markelov A.S.1, Trushin V.N.1, Chuprunov E.V.1
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Afiliações:
- Department of Physics
- Edição: Volume 61, Nº 1 (2018)
- Páginas: 148-152
- Seção: Laboratory Techniques
- URL: https://ogarev-online.ru/0020-4412/article/view/160117
- DOI: https://doi.org/10.1134/S0020441218010165
- ID: 160117
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Resumo
The possibility of forming specified surface profiles of X-ray optics elements (XROEs) for focusing and collimation of X-ray beams is considered. It is shown that the curvature of these elements can be controlled by varying the temperature of curvature regulator on the surface of which they are fixed in place. Using the calculated and experimental data, it is shown that inhomogeneity of the thickness of the curvature controller substrate influences the curvature and profile of XROEs. In particular, the possibility of obtaining parabolic and elliptical surface profiles of XROEs, which can be used to create adaptive X-ray optics elements for two-dimensional focusing and collimation of an X-ray beam is demonstrated.
Sobre autores
V. Gribko
Department of Physics
Autor responsável pela correspondência
Email: gribkovladimir@icloud.com
Rússia, Nizhny Novgorod, 603950
A. Markelov
Department of Physics
Email: gribkovladimir@icloud.com
Rússia, Nizhny Novgorod, 603950
V. Trushin
Department of Physics
Email: gribkovladimir@icloud.com
Rússia, Nizhny Novgorod, 603950
E. Chuprunov
Department of Physics
Email: gribkovladimir@icloud.com
Rússia, Nizhny Novgorod, 603950
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