A mobile microcell for measuring the electrical characteristics of individual nanowires and nanotubes


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Resumo

A mobile measuring cell was proposed and created using a focused ion beam as a nanoknife for measuring the electrical characteristics of individual nanowires and nanotubes by the four-wire method. The cell consists of two elements: the basic one, on whose surface a nanoconductor is deposited, and the auxiliary element that provides the electrical connection of the primary element to the wires of the external measuring circuit. Micro- and nanoscale wires in both elements of the cell were formed from gold films deposited on a silicon oxide surface. This provides reliable contacts between a nanoobject and the wires. In this paper, the application of the proposed method was demonstrated using examples of a multiwalled carbon nanotube and a thin platinum nanowire. The electrical resistance of the nanotube was measured using the two-wire method, whereas the current–voltage characteristic for the platinum nanowire was measured via the fourwire method.

Sobre autores

R. Volkov

MIET National Research University of Electronic Technology

Email: Gordon@ficp.ac.ru
Rússia, pl. Shokina 1, Zelenograd, Moscow, 124498

N. Borgardt

MIET National Research University of Electronic Technology

Email: Gordon@ficp.ac.ru
Rússia, pl. Shokina 1, Zelenograd, Moscow, 124498

V. Gurtovoi

Institute of Problems of Microelectronic Technology and Ultra-High-Purity Materials; Moscow Institute of Physics and Technology (State University)

Email: Gordon@ficp.ac.ru
Rússia, ul. Akademika Osip’yana 6, Chernogolovka, Moscow oblast, 142432; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700

A. Il’in

MIET National Research University of Electronic Technology

Email: Gordon@ficp.ac.ru
Rússia, pl. Shokina 1, Zelenograd, Moscow, 124498

A. Karabulin

MEPhI National Research Nuclear University

Email: Gordon@ficp.ac.ru
Rússia, Kashirskoe sh. 31, Moscow, 115409

V. Matyushenko

Talroze Institute of Energy Problems of Chemical Physics, Chernogolovka Branch

Email: Gordon@ficp.ac.ru
Rússia, pr. Akademika Semenova 1/10, Chernogolovka, Moscow oblast, 142432

I. Khodos

Institute of Problems of Microelectronic Technology and Ultra-High-Purity Materials

Email: Gordon@ficp.ac.ru
Rússia, ul. Akademika Osip’yana 6, Chernogolovka, Moscow oblast, 142432

E. Gordon

Institute of Problems of Chemical Physics

Autor responsável pela correspondência
Email: Gordon@ficp.ac.ru
Rússia, pr. Akademika Semenova 1, Chernogolovka, Moscow oblast, 142432

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