An energy dispersion scheme based on a semiconductor X-ray spectrometer and a broadband monochromator for determining the content of heavy elements from the absorption spectra

Abstract

An energy-dispersion scheme for determining the conсentrations of impurities of heavy elements from the absorption spectra in the regions of X-ray photoabsorption jumps is described. A semiconductor X-ray spectrometer and a pyrolytic graphite monochromator were used to record data in a spectral band of width up to 1 keV. The initial shape of the absorption spectrum in the approximation of an isolated atom was reconstructed by means of a numerical solution of the convolution equation. The scheme provides a sharp increase in the data acquisition and measurement sensitivity. The results of measurements of the Bi and Pb contents in samples with organic matrices and determination of the thicknesses of thin Mo films on diamond substrates are presented.