A method for obtaining 3D images of a sample by detecting scattered X rays with a pinhole camera
- Authors: Kaloyan A.A.1, Kovalenko E.S.1, Podurets K.M.1
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Affiliations:
- National Research Centre Kurchatov Institute
- Issue: Vol 60, No 1 (2017)
- Pages: 95-97
- Section: General Experimental Techniques
- URL: https://ogarev-online.ru/0020-4412/article/view/159446
- DOI: https://doi.org/10.1134/S0020441216060154
- ID: 159446
Cite item
Abstract
A method for studying the internal structure of a sample by detecting scattered synchrotron radiation using a pinhole camera is considered. The beam for imaging is shaped like a plane that intersects the sample. The characteristic spatial resolution of the method is 100 μm. Examples of the obtaining of images are presented, and the differences of this method from traditional techniques are discussed.
About the authors
A. A. Kaloyan
National Research Centre Kurchatov Institute
Email: Podurets_KM@nrcki.ru
Russian Federation, pl. Akademika Kurchatova 1, Moscow, 123182
E. S. Kovalenko
National Research Centre Kurchatov Institute
Email: Podurets_KM@nrcki.ru
Russian Federation, pl. Akademika Kurchatova 1, Moscow, 123182
K. M. Podurets
National Research Centre Kurchatov Institute
Author for correspondence.
Email: Podurets_KM@nrcki.ru
Russian Federation, pl. Akademika Kurchatova 1, Moscow, 123182
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